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SAE AS6171/2A
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Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection Remarking and Resurfacing and Surface Texture Analysis Using SEM Test Methods
| Published by | Publication Date | Number of Pages |
| SAE | 2017 | 31 |
SAE AS6171/2A – Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection Remarking and Resurfacing and Surface Texture Analysis Using SEM Test Methods
SAE AS6171/2A describes the requirements of the following test methods for counterfeit detection of electronic components:
- Method A: General EVI Sample Selection and Handling
- Method B: Detailed EVI including Part Weight measurement
- Method C: Testing for Remarking
- Method D: Testing for Resurfacing
- Method E: Part Dimensions measurement
- Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components microcircuits multi-chip modules (MCMs) and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract the base document AS6171 General Requirements shall also apply.
Product Details
- Published:
- 05/11/2017
- Number of Pages:
- 31
- File Size:
- 1 file 8 MB
- Note:
- This product is unavailable in Ukraine Russia Belarus
