SAE AS6171/2A

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection Remarking and Resurfacing and Surface Texture Analysis Using SEM Test Methods

Published by	Publication Date	Number of Pages
SAE	2017	31

SAE AS6171/2A – Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection Remarking and Resurfacing and Surface Texture Analysis Using SEM Test Methods

SAE AS6171/2A describes the requirements of the following test methods for counterfeit detection of electronic components:

Method A: General EVI Sample Selection and Handling
Method B: Detailed EVI including Part Weight measurement
Method C: Testing for Remarking
Method D: Testing for Resurfacing
Method E: Part Dimensions measurement
Method F: Surface Texture Analysis using SEM

The scope of this document is focused on leaded electronic components microcircuits multi-chip modules (MCMs) and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract the base document AS6171 General Requirements shall also apply.